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Particle-induced X-ray emission or proton-induced X-ray emission (PIXE) is a technique used in the determining of the elemental make-up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the x-ray part of the electromagnetic spectrum specific to an element. PIXE is a powerful yet non-destructive elemental analysis technique now used routinely by geologists, archaeologists, art conservators and others to help answer questions of provenance, dating and authenticity. The technique was first proposed in 1970 by Sven Johansson of Lund University, Sweden, and developed over the next few years with his colleagues Roland Akselsson and Thomas B Johansson.〔(Roland Akselsson mini-CV )- accessed 2008-01-29〕 Recent extensions of PIXE using tightly focused beams (down to 1 μm) gives the additional capability of microscopic analysis. This technique, called microPIXE, can be used to determine the distribution of trace elements in a wide range of samples. A related technique, particle-induced gamma-ray emission (PIGE) can be used to detect some light elements. ==Theory== Three types of spectra can be collected from a PIXE experiment: # X-ray emission spectrum. # Rutherford backscattering spectrum. # Proton transmission spectrum. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Particle-induced X-ray emission」の詳細全文を読む スポンサード リンク
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